/**
  ******************************************************************************
  * THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS "AS IS"
  * AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE
  * IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
  * DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR CONTRIBUTORS BE LIABLE
  * FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL
  * DAMAGES (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR
  * SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
  * CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY,
  * OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE
  * OF THIS SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.
  *
  * Copyright (C) 2023 Shanghai Eastsoft Microelectronics Co., Ltd. ALL rights reserved.
  *******************************************************************************
  */

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Version history:
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2023-04-26	V1.00	AE TEAM

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Demo introduction:
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本示例功能：MCU自带Flash模拟EEPROM，开辟两个4kByte Flash区域，实现按halfword(16bit)写数据和读数据功能。

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测试环境:
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测试用板：
ES-PDS-ES32VF2264LT

辅助工具：
无

辅助软件：
无

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测试步骤：
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1) 编译工程，编译通过后将程序下载到目标芯片；
2) 在线调试，将地址0x2000和0x3000加入Memory Window，将g_var_data_tab加入Watch Window；
3) 观察0x2000~0x2FFF和0x3000~0x3FFF的区域以及数组g_var_data_tab的数据变化。

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注意：
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1) 调试时在适当的位置打断点以便观察数据变化，比如main函数中的ee_read_variable行；
2) 32bit为一组数据，高16bit为模拟地址（禁止使用0xFFFF），低16bit为模拟地址对应的数据。

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System clock:
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Internal HRC 48MHz

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Pin connection: 
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无
